Publikacja
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Opis publikacji
Journal of Telecommunications and Information Technology, 2005, nr 1
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Struktura publikacji:
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2005, nr 1, JTIT - artykuły
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Jurczak, Małgorzata; Henson, Kirklen; Jurczak, Małgorzata: Challenges in scaling of CMOS devices towards 65 nm node Journal of Telecommunications and Information Technology, 2005, nr 1
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Schwalke, Udo, Gate dielectrics: process integration issues and electrical properties, Journal of Telecommunications and Information Technology, 2005, nr 1
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Tardif, Francois; Danel, Adrien; Raccurt, Olivier, Understanding of wet and alternative particle removal processes in microelectronics: theoretical capabilities and limitations, Journal of Telecommunications and Information Technology, 2005, nr 1
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Dziuban, Jan A.; Mróz, Jerzy; Koszur, Jan, Integrated gas chromatograph, Journal of Telecommunications and Information Technology, 2005, nr 1
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Jomaah, Jalal; Balestra, Francis; Ghibaudo, Gérard, Low frequency noise in advanced Si bulk and SOI MOSFETs, Journal of Telecommunications and Information Technology, 2005, nr 1
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Przewłocki, Henryk M.; Kudła, Andrzej; Brzezińska, Danuta; Massoud, Hisham Z., Variability of the local ΦMS values over the gate area of MOS devices, Journal of Telecommunications and Information Technology, 2005, nr 1
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Gotszalk, Teodor; Janus, Paweł; Marendziak, Andrzej; Czarnecki, Piotr; Radojewski, Jacek; Szeloch, Roman F.; Grabiec, Piotr; Rangelow, Ivo W., Diagnostics of micro- and nanostructure using the scanning probe microscopy, Journal of Telecommunications and Information Technology, 2005, nr 1
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Yoshitomi, Sadayuki; Kimijima, Hideki; Kojima, Kenji; Kokatsu, Hideyuki, An accurate prediction of high-frequency circuit behaviour, Journal of Telecommunications and Information Technology, 2005, nr 1
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Kisiel, Ryszard; Szczepański, Zbigniew, Trends in assembling of advanced IC packages, Journal of Telecommunications and Information Technology, 2005, nr 1
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Bieniek, Tomasz; Beck, Romuald B.; Jakubowski, Andrzej; Kudła, Andrzej, Ultra-shallow nitrogen plasma implantation for ultra-thin silicon oxynitride (SiOxNy) layer formation, Journal of Telecommunications and Information Technology, 2005, nr 1
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Firek, Piotr; Werbowy, Aleksander; Szmidt, Jan; Olszyna, Andrzej R., Properties of Al contacts to Si surface exposed in the course of plasma etching of previously grown nanocrystalline c-BN lm, Journal of Telecommunications and Information Technology, 2005, nr 1
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Sikora, Andrzej; Gotszalk, Teodor; Sankowska, Anna; Rangelow, Ivo W., Application of scanning shear-force microscope for fabrication of nanostructures, Journal of Telecommunications and Information Technology, 2005, nr 1
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Barański, Mateusz, TSSOI as an efficient tool for diagnostics of SOI technology in Institute of Electron Technology, Journal of Telecommunications and Information Technology, 2005, nr 1
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Łysko, Jan M.; Latecki, Bogdan; Nikodem, Marek; Górska, Marianna; Mróz, Jerzy; Małachowski, Marcin, Silicon TCD for the methane and carbon monoxide detection, Journal of Telecommunications and Information Technology, 2005, nr 1
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Łysko, Jan M.; Latecki, Bogdan; Nikodem, Marek, Gas micro-ow-metering with the in-channel Pt resistors, Journal of Telecommunications and Information Technology, 2005, nr 1
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Durov, Sergiy, DC and low-frequency noise analysis for buried SiGe channel metamorphic PMOSFETs with high Ge content, Journal of Telecommunications and Information Technology, 2005, nr 1
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Kudła, Andrzej; Przewłocki, Henryk; Brzezińska, Danuta; Borowicz, Lech, Photoelectric measurements of the local values of the effective contact potential difference in the MOS structure, Journal of Telecommunications and Information Technology, 2005, nr 1
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Rzodkiewicz, Witold; Kudła, Andrzej; Sawicki, Zbigniew; Przewłocki, Henryk M., Effects of stress annealing on the electrical and the optical properties of MOS devices, Journal of Telecommunications and Information Technology, 2005, nr 1
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Piskorski, Krzysztof; Kudła, Andrzej; Rzodkiewicz, Witold; Przewłocki, Henryk M., Comparison of the barrier height measurements by the Powell method with the ΦMS measurement results, Journal of Telecommunications and Information Technology, 2005, nr 1
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Zając, Jerzy; Wójcik, Janusz; Kociubiński, Andrzej; Tomaszewski, Daniel, Semi-automatic test system for characterization of ASIC/MPWS, Journal of Telecommunications and Information Technology, 2005, nr 1
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Tomaszewski, Daniel; Kociubiński, Andrzej; Marczewski, Jacek; Kucharski, Krzysztof; Domański, Krzysztof; Grabiec, Piotr, A versatile tool for extraction of MOSFETs parameters, Journal of Telecommunications and Information Technology, 2005, nr 1
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Grabiński, Władysław; Tomaszewski, Daniel; Lemaitre, Laurent; Jakubowski, Andrzej, Standardization of the compact model coding: non-fully depleted SOI MOSFET example, Journal of Telecommunications and Information Technology, 2005, nr 1
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Gajewski, Piotr; Łopatka, Jerzy; Piotrowski, Zbigniew, A new method of frequency offset correction using coherent averaging, Journal of Telecommunications and Information Technology, 2005, nr 1
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Islam, Imdadul; Hossain, Siddique, Comparison of traffic performance of QPSK and 16-QAM modulation techniques for OFDM system, Journal of Telecommunications and Information Technology, 2005, nr 1
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Islam, Imdadul; Hossain, Siddique, A newly developed random walk model for PCS network, Journal of Telecommunications and Information Technology, 2005, nr 1
