Biblioteka Cyfrowa

Barth, Wolfgang; Dębski, Tomasz; Barth, Wolfgang; Rangelow, Ivo W.; Domański, Krzysztof; Tomaszewski, Daniel; Grabiec, Piotr: Piezoresistive sensors for atomic force microscopy – numerical simulations by means of virtual wafer fab, Journal of Telecommunications and Information Technology, 2001, nr 1